Breakthrough Back-Illuminated CCD and EMCCD Detector Technology Sets a New Standard for Sensitivity
Until now, researchers interested in NIR imaging were compelled to use either front- or back-illuminated, deep-depletion CCDs. Each of these device architectures, however, has drawbacks. For example, front-illuminated sensors have 2x to 3x lower sensitivity than their back-illuminated counterparts, while the utility of deep depletion sensors is ultimately hindered by 100x greater dark current. By contrast, eXcelon sensors not only counter etaloning, they also boast ~90% peak quantum efficiency and do not increase dark current.
New eXcelon sensors provide excellent photon-detection capabilities across a wide spectrum, from 200nm to 1100nm, and are particularly beneficial for applications requiring enhanced sensitivity in the Blue and near-infrared (NIR) region. In addition, eXcelon back-illuminated sensors significantly reduce etaloning, the problematic appearance of fringes due to constructive and destructive interference in the device's back-thinned silicon while imaging in the NIR region (750-1100nm).
When eXcelon technology is applied to popular EMCCD devices, the result is a detector with sub-electron read noise, superb sensitivity, low dark current, little if any etaloning, and high frame rates - a combination unmatched in the world of CCD/CMOS sensors.
eXcelon-enabled cameras target a wide variety of applications in both the life sciences and physical sciences. Examples include astronomy, Raman spectroscopy, live-cell imaging, confocal imaging, Total Internal Reflection Fluorescence Microscopy (TIRFM), Förster Resonance Energy Transfer (FRET), Bose-Einstein Condensate (BEC) imaging, solar cell inspection, as well as super-resolution techniques such as STORM and PALM.