Two of the main components of read noise are “reset noise” and “amplifier noise”. Reset noise is a random offset created when a pixel is cleared of previous charge and can largely be eliminated using Correlated Double Sampling (CDS).
With reset noise largely eliminated by using CDS, amplifier noise becomes the dominant source of read noise. A special implementation of CDS, called Correlated Multi-Sampling (CMS), can be used to reduce this noise contribution even further.
Programmable Scan Mode
Programmable Scan Mode provides increased control over the rolling shutter exposure and read-out functionality of CMOS sensors. The rolling shutter read-out behavior is a common implementation on CMOS sensors, and Programmable Scan Mode provides access to the sensor timing settings to allow optimization around imaging requirements.